FAME Bundle 1 – Courses 1 to 3

For all enquiries and information about pricing and tailored group sizes, please contact fame@acer.org

SKU : PPE894

$2,970.00
SKU
PPE894
In stock

ACER's Foundation in Applied Measurement in Education (FAME) is a suite of 8 short, online, modular courses.

Rasch modelling short courses cover:

  • introductory concepts and theoretical understanding of educational assessment and measurement
  • item and test analysis
  • differential item functioning
  • test equating
  • psychometric analysis reports
  • large-scale analysis of educational data

COURSES 1 AND 2 Focus on the theoretical foundations that are essential to large-scale educational assessment.

COURSES 3 TO 8 Focus on applying the skills and require ACER ConQuest® software. Course 7 and 8 is offered for advanced analysis of large-scale education data. For more information about ACER ConQuest®, please go to the ACER ConQuest webpage.

FAME Bundle 1 includes Courses 1 to 3:

FAME 1 Foundations of educational measurement (Beginner level or refresher. 1 day. No additional software)

  • Introduces the foundational concepts of educational assessment and measurement.
  • Examines key concepts of reliability, validity, latent variables and measurement error.
  • Covers basic statistical concepts used in educational measurement and reporting.

FAME 2 Classical Test Theory and Item Response Theory (Advanced beginners / FAME 1. 1 day. No additional software)

  • Introduces the foundational concepts of educational assessment and measurement.
  • Examines key concepts of reliability, validity, latent variables and measurement error.
  • Covers basic statistical concepts used in educational measurement and reporting.

FAME 3 Item and test analysis using ACER ConQuest® (Intermediate–proficient level / FAME 1&2 / Experienced analysts. 1.5 days. ACER ConQuest® software)

  • Involves conducting and interpreting a psychometric analysis of multiple-choice assessment using ACER ConQuest® software to inform refinements to an existing measure. It analyses assessment items where partial credit scoring applies.
  • Participants apply both the Rasch model and the one parameter logistic (IRT) model. Participants will work with models for dichotomous and for polytomous data.

Optional: Bring your own data (BYOD) sessions for Course 3 and 4: $550 per session.

  • provides participants with an opportunity to apply newly learnt skills to their own data, share results with facilitators and have a live Q&A.
  • a 1-hour workshop (in addition to standard inclusions) for each BYOD session.

To purchase the BYOD session for Course 3, please add the BYOD session to your cart in addition to your bundle.