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Monteiro Interview Guidelines for Diagnosing the Autism Spectrum, 2nd Edition (MIGDAS-2)
Starting at $53.13
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FAME Bring your own data (BYOD) Session – Course 4
For all enquiries and information about pricing and tailored group sizes, please contact fame@acer.org
SKU : PPE894_5
$550.00
SKU
PPE894_5
In stock
ACER's Foundation in Applied Measurement in Education (FAME) is a suite of 8 short, online, modular courses.
Rasch modelling short courses cover:
- introductory concepts and theoretical understanding of educational assessment and measurement
- item and test analysis
- differential item functioning
- test equating
- psychometric analysis reports
- large-scale analysis of educational data
COURSES 1 AND 2 Focus on the theoretical foundations that are essential to large-scale educational assessment.
COURSES 3 TO 8 Focus on applying the skills and require ACER ConQuest® software. Course 7 and 8 is offered for advanced analysis of large-scale education data. For more information about ACER ConQuest®, please go to the ACER ConQuest webpage.
FAME Bring your own Device (BYOD) Session – Course 4
- provides participants with an opportunity to apply newly learnt skills to their own data, share results with facilitators and have a live Q&A.
- a 1-hour workshop (in addition to standard inclusions) for each BYOD session.
