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Foundations in Applied Measurement in Education (FAME)
A suite of 8 short, online, modular courses. Refer below for course dates.
For all enquiries and information about pricing and tailored group sizes, please contact fame@acer.org
SKU : PG_FAME
In stock
SKU
PG_FAME
In stock
ACER's Foundation in Applied Measurement in Education (FAME) is a suite of 8 short, online, modular courses.
IRT short courses cover:
- introductory concepts and theoretical understanding of educational assessment and measurement
- item and test analysis
- differential item functioning
- test equating
- psychometric analysis reports
- large-scale analysis of educational data
COURSES 1 AND 2 Focus on the theoretical foundations that are essential to large-scale educational assessment.
COURSES 3 TO 8 Focus on applying the skills and require ACER ConQuest® software. Course 7 and 8 is offered for advanced analysis of large-scale education data. For more information about ACER ConQuest®, please go to the ACER ConQuest webpage.
Course Dates
- Course 1: Week beginning 2/9/24. Live session 4/9/24, 4PM AEST
- Course 2: Week beginning 9/9/24. Live session 11/9/24, 4PM AEST
- Course 3: Week beginning 16/9/24. Live session 18/9/24, 4PM AEST
- Course 4: Week beginning 23/9/24. Live session 25/9/24, 4PM AEST
- Course 5: Week beginning 30/9/24. Live session 2/10/24, 4PM AEST
- Course 6: Week beginning 7/10/24. Live session 9/10/24, 4PM AEST
- Course 7: Week beginning 14/10/24. Live session 16/10/24, 4PM AEST
- Course 8: Week beginning 21/10/24. Live session 23/10/24, 4PM AEST
FAME 1 Foundations of educational measurement
- Beginner level or refresher.
- 1 day. No additional software
Introduces the foundational concepts of educational assessment and measurement.
Examines key concepts of reliability, validity, latent variables and measurement error.
Covers basic statistical concepts used in educational measurement and reporting.
FAME 2 Classical Test Theory and Item Response Theory
- Advanced beginners / FAME 1.
- 1 day. No additional software
Introduces the foundational concepts of educational assessment and measurement.
Examines key concepts of reliability, validity, latent variables and measurement error.
Covers basic statistical concepts used in educational measurement and reporting.
FAME 3 Item and test analysis using ACER ConQuest®
- Intermediate–proficient level / FAME 1&2 / Experienced analysts.
- 1.5 days. ACER ConQuest® software
Involves conducting and interpreting a psychometric analysis of multiple-choice assessment using ACER ConQuest® software to inform refinements to an existing measure. It analyses assessment items where partial credit scoring applies.
Participants apply both the Rasch model and the one parameter logistic (IRT) model.
Participants will work with models for dichotomous and for polytomous data.
FAME 4 Differential Item Functioning (DIF)
- Proficient–advanced / FAME 1–3 / Experienced analysts.
- 2 days. ACER ConQuest® software
Explores important validity and comparability questions through an Item Response Theory paradigm by introducing participants to Differential Item Functioning (DIF) and requiring them to undertake a DIF analysis using ACER ConQuest®.
FAME 5 Test equating
- Advanced / FAME 1–3 / Experienced analysts.
- 2 days. ACER ConQuest® software
Explores test equating methods using the one parameter logistic (IRT) model. Participants will learn to equate 2 assessments on a common measurement scale through common item equating.
FAME 6 Automated psychometric analysis score reports with conquestr
- Advanced / FAME 1–3 / Experienced analysts.
- 1.5 days. ACER ConQuest®, conquestr and RStudio software
Introduces participants to the conquestr package that interfaces with ACER ConQuest® software. Participants will use R and RStudio with conquestr output to produce an automated and reproducible psychometric analysis and reporting workflow for quality assuring multiple-choice assessments.
FAME 7 Working with plausible values
- Advanced / FAME 1–6 / Experienced analysts.
- 2 days. ACER ConQuest®, conquestr and RStudio software
Introduces the theory behind different item response models and case ability estimation routines that can be used to estimate population parameters reliably. Participants will apply this knowledge to fit a combined item response and population model, similar to those seen in large-scale assessment programs such as NAPLAN and the Programme for International Student Assessment, and to correctly apply the law of total variance to undertake secondary analysis to yield unbiased population parameter estimates.
FAME 8 Complex survey designs in large-scale assessment
- Advanced / FAME 1–6 / Experienced analysts.
- 2 days. ACER ConQuest®, conquestr and RStudio software
Introduces complex survey designs used in large-scale assessment programs to accurately estimate population parameters that are representative of national or sub-national populations of interest. Participants will apply this knowledge to correctly apply the law of total variance to undertake secondary analysis to yield unbiased population parameter estimates using plausible values, and in addition using replicate weights to perform re-sampling to account for sampling error.
Optional: Bring your own data (BYOD) sessions for Course 3 and 4: $550 per session.
- provides participants with an opportunity to apply newly learnt skills to their own data, share results with facilitators and have a live Q&A.
- a 1-hour workshop (in addition to standard inclusions) for each BYOD session.
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